Development of the new method for determination of 3D nano atomic and electronic structure of materials based on XAFS, XRD and Raman techniques

Abstract

Development of the new method for determination of 3D nano atomic and electronic structure of materials based on XAFS, XRD and Raman techniques

Smirnova Yu.O., Polozhentsev O.E., Leontieva D.V., Chainikov A.P., Suchkova S.A., Guda A.A., Lomachenko K.A., Smolentsev N.Yu., Podkovyrina Yu.S., Soldatov M.A., Kravtsova A.N., Soldatov A.V.

Combined method which allows analyzing parameters of the nanoscale atomic and electronic structure of materials relying on three different methods (x-ray absorption spectroscopy (XAFS), x-ray diffraction (XRD) and Raman spectroscopy) was developed. The method was applied for the study of nickel oxide nanoparticles, which serve as an efficient catalyst for the artificial photosynthesis process. 

Keywords: solar energy, artificial photosynthesis, NiO, Raman, x-ray diffraction, XAFS